Reliability and wearout characterisation of LEDs

Microelectronics Reliability

Volumn 46, Issue 9-11, 2006, Pages 1711-1714

  Jacob, P ^a,b   Kunz, A ^a   Nicoletti, G ^a  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^b EM Microelectronic   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC RESISTANCE; ELECTRONIC EQUIPMENT; LEAKAGE CURRENTS; NETWORKS (CIRCUITS); RELIABILITY;

DEGRADATION MECHANISMS; ELECTRONIC CIRCUITRY; LEAKAGE PATHS; OPTOCOUPLERS;

LIGHT EMITTING DIODES;

EID: 33747805566     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2006.07.048     Document Type: Article

References (2)

1. Birolini A. Reliability Engineering - Theory and Practice. third ed. (1999), Springer Verlag, Berlin Heidelberg, New York p.135-136
2. Ott M. Capabilities and Reliability of LEDs and Laser Diodes. What's New in Electronics, vol. 20 Nr. 6, November 2000. Also published in 1997 by NASA Electronic Parts and Packaging Program, see: http://nepp.nasa.gov/photonics/pdf/sources1.pdf.