Reliability challenges in the nanoelectronics era

Microelectronics Reliability

Volumn 46, Issue 9-11, 2006, Pages 1403-1414

  van Roosmalen, A J ^a   Zhang, G Q ^a,b  

^a NXP SEMICONDUCTORS   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

MICROELECTRONICS; RELIABILITY; RESEARCH AND DEVELOPMENT MANAGEMENT; SEMICONDUCTOR MATERIALS;

EUROPEAN TECHNOLOGY PLATFORM; NANOELECTRONICS; STRATEGIC RESEARCH AGENDA (SRA);

NANOSTRUCTURED MATERIALS;

EID: 33747778662     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2006.07.011     Document Type: Article

References (6)

1. Van Roosmalen AJ. Strategic Research Agenda of Nanoelectronics, Eniac, first edition, 2005.
2. Baldi L. Priority summary of Eniac SRA, June, 2006.
3. Zhang GQ, Van Roosmalen AJ, Graef M. The rationale and paradigm of More than Moore, proceedings of 56th ECTC, ISSN 0569-5503, USA, 2006;151-156.
4. International Technology Roadmap of Semiconductors (ITRS), 2005.
5. Zhang GQ, Van Driel W and Fan XJ. Mechanics of microelectronics, Series: Solid Mechanics and Its Applications, vol. 141, ISBN: 1-4020-4934-X, Springer, 2006.
6. Zhang GQ. Lecture note, Virtual prototyping and qualification of micro/nanoelectronics, TUD, 2005.