Transferring self-assembled, nanoscale cables into electrical devices

Journal of the American Chemical Society

Volumn 128, Issue 33, 2006, Pages 10700-10701

  Xiao, Shengxiong ^a   Tang, Jinyao ^a   Beetz, Tobias ^b   Guo, Xuefeng ^a   Tremblay, Noah ^a   Siegrist, Theo ^c   Zhu, Yimei ^b   Steigerwald, Michael ^a   Nuckolls, Colin ^a  

^a Och Spine at New York Presbyterian Hospitals   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALKANE; CARBON; DODECANE; HEXABENZOCORONENE; UNCLASSIFIED DRUG;

ARTICLE; CHEMICAL STRUCTURE; DEVICE; DIFFERENTIAL SCANNING CALORIMETRY; ELECTRON DIFFRACTION; ELECTRONICS; IMAGE ANALYSIS; NANOTECHNOLOGY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR; TRANSMISSION ELECTRON MICROSCOPY; X RAY POWDER DIFFRACTION;

EID: 33747773738     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja0642360     Document Type: Article

References (26)

1. Xiao, S.; Myers, M.; Miao, Q.; Sanaur, S.; Pang, K.; Steigerwald, M. L.; Nuckolls, C. Angew. Chem., Int. Ed. 2005, 44, 7390-7394.
2. Lovinger, A. J.; Nuckolls, C.; Katz, T. J. J. Am. Chem. Soc. 1998, 120, 264-268.
3. Hill, J. P.; Jin, W.; Kosaka, A.; Fukushima, T.; Ichihara, H.; Shimomura, T.; Ito, K.; Hashizume, T.; Ishii, N.; Aida, T. Science 2004, 304, 1481-1483.
4. Kato, T.; Mizoshita, N.; Moriyama, M.; Kitamura, T. Top. Curr. Chem. 2005, 256, 219-236.
5. Bushey, M. L.; Nguyen, T.-Q.; Zhang, W.; Horoszewski, D.; Nuckolls, C. Angew. Chem., Int. Ed. 2004, 43, 5446-5453.
6. Huang, X. M. H.; Caldwell, R.; Huang, L.; Jun, S. C.; Huang, M.; Sfeir, M. Y.; O'Brien, S. P.; Hone, J. Nano Lett. 2005, 5, 1515-1518.
7. Dimitrakopoulos, C. D.; Malenfant, P. R. L. Adv. Mater. 2002, 14, 99-117.
8. Horowitz, G. Adv. Mater. 1998, 10, 365-377.
9. Garnier, F. Chem. Phys. 1998, 227, 253-262.
10. Wang, Z.; Doetz, F.; Enkelmann, V.; Muellen, K. Angew. Chem., Int. Ed. 2005, 44, 1247-1250.
11. Wurthner, F. Chem. Commun. 2004, 1564-1579.
12. A full pattern fit was used to refine the unit cell parameters, giving an overall agreement factor Rwp = 0.17% (program "Winprep" 2005-02-14; diffraction pattern modifier by Kenny Stahl, Department of Chemistry, Technical University of Denmark, DK-2800 Lynby, Denmark; kenny@ kemi.dtu.dk). See the Supporting Information.
13. Cavallini, M.; Stoliar, P.; Moulin, J.-F.; Surin, M.; Leclere, P.; Lazzaroni, R.; Breiby, D. W.; Andreasen, J. W.; Nielsen, M. M.; Sonar, P.; Grimsdale, A. C.; Mullen, K.; Biscarini, F. Nano Lett. 2005, 5, 2422-2425.
14. Kastler, M.; Pisula, W.; Wasserfallen, D.; Pakula, T.; Muellen, K. J. Am. Chem. Soc. 2005, 127, 4286-4296.
15. Boden, N.; Bushby, R. J.; Lozman, O. R. Mol. Cryst. Liq. Cryst. 2003, 400, 105-113.
16. Piris, J.; Debije, M. G.; Stutzmann, N.; van de Craats, A. M.; Watson, M. D.; Muellen, K.; Warman, J. M. Adv. Mater. 2003, 15, 1736-1740.
17. Meitl, M. A.; Zhou, Y.; Gaur, A.; Jeon, S.; Usrey, M. L.; Strano, M. S.; Rogers, J. A. Nano Lett. 2004, 4, 1643-1647.
18. Sun, Y.; Rogers, J. A. Nano Lett. 2004, 4, 1953-1959.
19. Menard, E.; Lee, K. J.; Khang, D.-Y.; Nuzzo, R. G.; Rogers, J. A. Appl. Phys. Lett. 2004, 84, 5398-5400.
20. 2.
21. van de Craats, A. M.; Warman, J. M.; Fechtenkotter, A.; Brand, J. D.; Harbison, M. A.; Mullen, K. Adv. Mater. 1999, 11, 1469-1472.
22. Pisula, W.; Menon, A.; Stepputat, M.; Lieberwirth, I.; Kolb, U.; Tracz, A.; Sirringhaus, H.; Pakula, T.; Muellen, K. Adv. Mater. 2005, 17, 684-689.
23. Pesavento, P. V.; Chesterfield, R. J.; Newman, C. R.; Frisbie, C. D. J. Appl. Phys. 2004, 96, 7312-7324.
24. Blanchet, G. B.; Fincher, C. R.; Lefenfeld, M.; Rogers, J. A. Appl. Phys. Lett. 2004, 84, 296-298.
25. Lang, D. V.; Chi, X.; Siegrist, T.; Sergent, A. M.; Ramirez, A. P. Phys. Rev. Lett. 2004, 93, 076601.
26. Chang, J. B.; Subramanian, V. Appl. Phys. Lett. 2006, 88, 233513.