Human face measurement by projecting bandlimited random patterns

Optics Express

Volumn 14, Issue 17, 2006, Pages 7692-7698

  Wiegmann, A ^a   Wagner, H ^a   Kowarschik, R ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; MEDICAL APPLICATIONS; NOISE ABATEMENT; PATTERN MATCHING; SPURIOUS SIGNAL NOISE;

HUMAN FACE MEASUREMENT; PIXEL; RANDOM PATTERNS; STANDARD DEVIATION;

FACE RECOGNITION;

EID: 33747765882     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.14.007692     Document Type: Conference Paper

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