Progress in reliability research in the micro and nano region

Microelectronics Reliability

Volumn 46, Issue 9-11, 2006, Pages 1685-1694

  Wunderle, B ^a   Michel, B ^a  

^a FRAUNHOFER IZM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; INTEGRATED CIRCUIT LAYOUT; LARGE SCALE SYSTEMS; MICROELECTRONICS; NANOSTRUCTURED MATERIALS; RELIABILITY;

INTEGRATION TECHNIQUES; MECHANICAL RELIABILITY; NANO RELIABILITY;

ELECTRONICS PACKAGING;

EID: 33747759337     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2006.08.005     Document Type: Article

References (38)

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