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Volumn 64, Issue 8, 2006, Pages 775-777

New eddy current technique for printed circuit board control

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; EDDY CURRENTS; MAGNETIC FIELDS; NONDESTRUCTIVE EXAMINATION; OPTICAL TESTING; SIGNAL PROCESSING;

EID: 33747757699     PISSN: 00255327     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article
Times cited : (2)

References (8)
  • 1
    • 11344284981 scopus 로고
    • About suppression of noise parameters by the eddy current inspection
    • Bilik, Y., "About Suppression of Noise Parameters by the Eddy Current Inspection," Defectoscapia, Vol. 8, 1979, pp. 26-32.
    • (1979) Defectoscapia , vol.8 , pp. 26-32
    • Bilik, Y.1
  • 2
    • 33747774412 scopus 로고    scopus 로고
    • The GKN-1 device for revealing shorts and Japes of printed windings for planar transformers
    • December, Israel (in Hebrew)
    • Bilik, Y., "The GKN-1 Device for Revealing Shorts and Japes of Printed Windings for Planar Transformers," Reports of the National Conference on Non-destructive Methods, December 2004, Israel, pp. 37-38 (in Hebrew).
    • (2004) Reports of the National Conference on Non-destructive Methods , pp. 37-38
    • Bilik, Y.1
  • 3
    • 33747758245 scopus 로고
    • 'Proba'-rype electromagnetic inspection instruments
    • Bilik, Y. and A. Dorofeev, '"Proba'-rype Electromagnetic Inspection Instruments," Nondestructive Testing, Vol. 17, 1982, pp. 447-452.
    • (1982) Nondestructive Testing , vol.17 , pp. 447-452
    • Bilik, Y.1    Dorofeev, A.2
  • 4
    • 33747775411 scopus 로고
    • New method of calculation for signal and sensitivity values of eddy current modulation flaw detector
    • Bilik, Y. and N. Rodigin, "New Method of Calculation for Signal and Sensitivity Values of Eddy Current Modulation Flaw Detector," Defectoscopia, Vol. 6, 1975, pp. 101-106.
    • (1975) Defectoscopia , vol.6 , pp. 101-106
    • Bilik, Y.1    Rodigin, N.2
  • 5
    • 33747799893 scopus 로고
    • A device and a method of multilayer products' inspection
    • Bilik, Y., I. Roitburd and M. Slutskaya, "A Device and a Method of Multilayer Products' Inspection," USSR Bulletin of Inventions, No. 47, 1980, p. 120.
    • (1980) USSR Bulletin of Inventions , Issue.47 , pp. 120
    • Bilik, Y.1    Roitburd, I.2    Slutskaya, M.3
  • 6
    • 33747778618 scopus 로고
    • Static eddy current haw detector with suppression of 'lift-off'
    • Bilik, Y., N. Savorovsky and S. Kutsevitsky, "Static Eddy Current Haw Detector with Suppression of 'Lift-off,'" USSR Bulletin of Inventions, No. 5, 1982, p. 166.
    • (1982) USSR Bulletin of Inventions , Issue.5 , pp. 166
    • Bilik, Y.1    Savorovsky, N.2    Kutsevitsky, S.3
  • 7
    • 33747752126 scopus 로고    scopus 로고
    • "Methods and Devices for Eddy Current PCB Inspection," US Patent 6, 975, 108
    • Bilik, Y., E. Keydar and V. Boroda, "Methods and Devices for Eddy Current PCB Inspection," US Patent 6, 975, 108, 2005.
    • (2005)
    • Bilik, Y.1    Keydar, E.2    Boroda, V.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.