A S-VHS compatible 1/3" 720(H)∗588(V) FT-CCD with low dark current by surface pinning

Technical Digest - International Electron Devices Meeting, IEDM

Volumn 1992-December, Issue , 1992, Pages 97-100

  Bosiers, J T ^a   Peek, H L ^a   Kleimann, A C ^a   Daemen, N J ^a   Roks, E ^a   Van Der Sijde, A G ^a   Jansen, R M ^a   Opmeer, P ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CCD IMAGERS; COLOR FILTERS; FRAME TRANSFER CCD; LOW COSTS; ON CHIPS; OPTICAL FORMATS; SURFACE PINNING;

ELECTRON DEVICES;

EID: 33747737648     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.1992.307317     Document Type: Conference Paper

References (7)

1. J. Bosiers et al., A 2/3" 1188(H) 484(V) frame-transfer CCD for ESP and Movie, 1982 Intl. Electron Dev. Conf., IEDM'88 Digest pp. 70-73.
2. H. Akimoto at al., "A 1/3-in 410 000-pixel CCD image sensor with feedback field-plate amplifier, " IEEE J. Solid State Circuits, vol. 38 no. 12 pp. 1907-1914 (1991).
3. C. Mizouchi et al., "1/3-inch 410 000 pixel IT-CCD image sensor, Proc. Intl. Television Engineering Conference 1992 (ITEC'92), pp. 453-454.
4. N. S. Saks, "A technique for suppressing dark current generated by interface states in buried channel CCD imagers", IEEE Electron Dev. Lett., vol. 1 no. 7, 1980
5. N. Teranishi et al., "No image lag photodiode structure in the interline CCD image sensor", 1982 Intl. Electron Dev. Conf., IEDM'82 Digest pp. 324-327.
6. J. Janesick, T. Elliot, G. Fraschetti, S. Collins, "Charge-coupled device pinning technologies", SPIE Conf. on Optical Sensors and Electronic Photography, Los Angeles, CA, 1989, Proc. SPIE vol. 1071-15.
7. B. Burke and S. Gajar, "Dynamic Suppression of interface-state dark current in buried-channel CCD's", IEEE Trans. Electr. Dev., vol. 38 no. 2 pp. 285-290 (1991).