Enhanced iris matching using estimation of in-plane nonlinear deformations

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6202, Issue , 2006, Pages

  Thornton, Jason ^a   Savvides, Marios ^a   Kumar, B V K Vijaya ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Iris recognition; Pattern deformation; Pattern matching

Indexed keywords

IRIS IMAGES; IRIS RECOGNITION; MAXIMUM A POSTERIORI PROBABILITY (MAP); PATTERN DEFORMATION;

ALGORITHMS; DATABASE SYSTEMS; IMAGE ANALYSIS; PROBABILITY;

PATTERN MATCHING;

EID: 33747684153     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.666626     Document Type: Conference Paper

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