The seeker experimental system at MIT lincoln laboratory

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6208, Issue , 2006, Pages

  Hayes, Alexander G ^a   Downs, George ^a   Gabrielson, Anthony ^a   Harrison, David C ^a   Hines, Eric L ^a   Jiang, Leaf A ^a   Richardson, Jonathan M ^a   Swenson, Jonathan ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Cryogenic; Infrared; NODDS; Radiometric; Seeker

Indexed keywords

NODDS; OPTICAL SYSTEM TEST FACILITY (OSTF); RADIOMETRIC CALIBRATION; SEEKER EXPERIMENTAL SYSTEM (SES);

ALGORITHMS; CALIBRATION; CRYOGENIC EQUIPMENT; EXPERIMENTS; INFRARED DEVICES; LABORATORIES; MILITARY APPLICATIONS; OPTICAL SENSORS; RADIOMETRY; THERMAL EFFECTS;

OPTICAL SYSTEMS;

EID: 33747668140     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.663801     Document Type: Conference Paper

References (6)

1. D.C. Harrison, A.G. Hayes, L.A. Jiang, E.L. Hines, and J. Richardson, "The MIT Lincoln Laboratory Optical Systems Test Facility", SPIE Conference 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop- Testing XI, April 2006
2. M. Thomas, D. Newman, M. Froli, D. Prichett, and C. Person, "Nonuniformity correction of cryogenic 512 emitter arrays: The 5 minute 5% NUC using FIESTA", Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI, 2001 SPIE, Vol. 4366, pp 465-474
3. A.G. Hayes, F.J. Caraco, D.C. Harrison, and J.M. Sorvari, "Characterization and Comparison of 128×128 element Nuclear Optical Dynamic Display System (NODDS) Resistive Arrays", SPIE Conference 6208, Technologies for Synthetic Environments: Hardare-in-the-Loop- Testing XI, April 2006
4. K. Edwards and W. Kornegay, "Measurements, Phenomenology, and Discrimination", Lincoln Laboratory Journal, Volume 13, Number 1, 2002, pp75-108
5. D.R. Crow, "Composite hardbody and missile plume (CHAMP 98) IR scene generation program", Proceedings of SPIE - Volume 3368 Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III, R.L. Murrer, Jr., July 1998, pp. 256-268
6. D. Rabinkin, E. Rutledge, and P. Monticciolo, "Missile Signal Processing Common Computer Architecture for Rapid Technology Upgrade", Proc. Of the SPIE Vol. 5559, pp 131-145, Aug. 2004.