A SPICE model of the ohmic side of double-sided Si microstrip detectors

IEEE Transactions on Nuclear Science

Volumn 44, Issue 3 PART 1, 1997, Pages 728-735

  Candelori, A ^a,b   Paccagnella, A ^a,b   Bonin, F ^a   Bacchetta, N ^b   Da Rold, M ^a,b   Biselio, D ^a,b  

^a UNIVERSITY OF PADOVA   (Italy)

^b SEZIONE DI PADOVA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33747653618     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.603741     Document Type: Article

References (12)

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6. N. Bacchetta, D. Bisello, C. Calgarotto, A. Candelori, A. Paccagnella, "A SPICE Model for Si Microstrip Detectors and Read-out Electronics," IEEE Trans. Nucl. Sci., vol.NS-43, 1996
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10. M. Raymond and L. Jones, RD20 PreShape32 User Manual
11. H.-J. Ziock, et al., "Test of the radiation hardness of VLSI Integrated Circuits and Silicon Strip Detectors for the SSC Under Neutron Proton and Gamma Irradiation," IEEE Trans. Nucl. Sci., vol.NS-38, 1991
12. H.F.-W. Sadrozinski, et al., "Limits to the use of Irradiated Silicon Detectors," Santa Cruz Institute for Particle Physics SCIPP 94/06