Wavelet-aided spatial carrier fringe pattern analysis for 3-D shape measurement

Optical Engineering

Volumn 44, Issue 11, 2005, Pages

  Zhou, Jian ^a,b  

^a Sensitron Semiconductor   (United States)

^b United Toll Systems   (United States)

Author keywords

3 D shape measurement; Optical fringe projection; Phase extraction; Spatial carrier fringe analysis; Spectra analysis; Wavelet analysis

Indexed keywords

APPROXIMATION THEORY; CARRIER COMMUNICATION; LIGHT MODULATION; PATTERN RECOGNITION; SPECTRUM ANALYSIS; WAVELET TRANSFORMS;

OPTICAL FRINGE PROJECTION; PHASE EXTRACTION; SHAPE MEASUREMENT; SPATIAL CARRIER FRINGE ANALYSIS;

OPTICAL COMMUNICATION;

EID: 33747615746     PISSN: 00913286     EISSN: 15602303     Source Type: Journal    
DOI: 10.1117/1.2127887     Document Type: Article

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