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Volumn 386, Issue 1, 2006, Pages 12-20

Laser ablation inductively coupled plasma mass spectrometry for direct analysis of the spatial distribution of trace elements in metallurgical-grade silicon

Author keywords

Elemental segregation; LA ICP MS; Metallurgical grade silicon; Quantification

Indexed keywords

INDUCTIVELY COUPLED PLASMA; LASER ABLATION; MASS SPECTROMETRY; METALLURGY; SEGREGATION (METALLOGRAPHY); SILICON;

EID: 33747591185     PISSN: 16182642     EISSN: 16182650     Source Type: Journal    
DOI: 10.1007/s00216-006-0658-0     Document Type: Conference Paper
Times cited : (17)

References (40)
  • 1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.