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Volumn 386, Issue 1, 2006, Pages 12-20
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Laser ablation inductively coupled plasma mass spectrometry for direct analysis of the spatial distribution of trace elements in metallurgical-grade silicon
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Author keywords
Elemental segregation; LA ICP MS; Metallurgical grade silicon; Quantification
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Indexed keywords
INDUCTIVELY COUPLED PLASMA;
LASER ABLATION;
MASS SPECTROMETRY;
METALLURGY;
SEGREGATION (METALLOGRAPHY);
SILICON;
ELEMENTAL SEGREGATION;
LA-ICP-MS;
METALLURGICAL-GRADE SILICON;
TRACE ELEMENTS;
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EID: 33747591185
PISSN: 16182642
EISSN: 16182650
Source Type: Journal
DOI: 10.1007/s00216-006-0658-0 Document Type: Conference Paper |
Times cited : (17)
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References (40)
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