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Volumn 55, Issue 7, 2006, Pages 3622-3628
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Current slump mechanism and its physical model of AlGaN/GaN HEMTs under DC bias
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Author keywords
AlGaN GaN HEMT; Current slump; DC sweep; Model
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Indexed keywords
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EID: 33747503897
PISSN: 10003290
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (3)
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References (10)
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