Potential-Seebeck-Microprobe(PSM): Measuring the spatial resolution of the seebeck coefficient and the electric potential

International Conference on Thermoelectrics, ICT, Proceedings

Volumn 2005, Issue , 2005, Pages 13-16

  Platzek, D ^a,b   Karpinski, G ^b   Stiewe, C ^b   Ziolkowski, P ^b   Drasar, C ^b,c   Muller E ^b  

^a Physics Technology Development and Consulting (PANCO)   (Germany)

^b GERMAN AEROSPACE CENTER DLR   (Germany)

^c UNIVERSITY OF PARDUBICE   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; ELECTRIC POWER GENERATION; SEEBECK EFFECT; SEMICONDUCTOR MATERIALS;

SCANNING SEEBECK MICROPROBE; TEMPERATURE GRADIENTS; THERMOELECTRIC GENERATORS; THERMOELECTRIC SEMICONDUCTORS;

THERMOELECTRIC POWER PLANTS;

EID: 33747445931     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICT.2005.1519875     Document Type: Conference Paper

References (5)

1. P. Reinshaus et al., Proc. 2nd Europ. Symposium on Thermoelectrics - Materials, Processing Techniques, and Applications, Dresden, Germany 1994, 90.
2. D. Platzek et al. "An Automated Microprobe for Temperature Dependent Spatial Scanning of the Seebeck Coefficient", Proc. 22nd Int. Conf. on Thermoelectrics (ICT2003), La Grande Motte, France, IEEE, Piscataway 2004, p. 528-531.
3. D. Platzek et al. "Anisotropy of the Seebeck Coefficient Detected by the Seebeck Scanning Microprobe", Proc. VIIIth European Workshop on Thermoelectrics. 2004. Krakow Poland: University of Krakow.
4. 0.15 Single Crystals", Proc. VIIth European Workshop on Thermoelectrics 2002, Pamplona, Spain.
5. E. Müller et al. "Functionally Graded Materials for Sensor and Energy Applications", Mat. Sci. Eng. A362 (2003) 17-39.