KTaO3 powders and thin films prepared by polymeric precursor method

Solid State Sciences

Volumn 8, Issue 6, 2006, Pages 606-612

  Tavora Weber, Ingrid ^a   Audebrand, Nathalie ^a   Bouquet, Valérie ^a   Guilloux Viry, Maryline ^a   Perrin, André ^a  

^a INSTITUT DES SCIENCES CHIMIQUES DE RENNES   (France)

Author keywords

Diffraction line broadening analysis; KTaO3; Polymeric precursor method; Powder X ray diffraction; Thin films

Indexed keywords

COST EFFECTIVENESS; ENERGY DISPERSIVE SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; STOICHIOMETRY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

DIFFRACTION LINE-BROADENING ANALYSIS; PECHINI METHOD; POLYMERIC PRECURSOR METHOD;

PEROVSKITE;

EID: 33747427999     PISSN: 12932558     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solidstatesciences.2006.01.011     Document Type: Article

References (31)

1. Bae H.J., Sigman J., Park S.J., Heo Y.H., Boatner L.A., and Norton D.P. Solid State Elect. 48 (2004) 51
2. Lee J.S., Khim Z.G., Park Y.D., Norton D.P., Theodoropoulou N.A., Hebard A.F., Budai J.D., Boatner L.A., Pearton S.J., and Wilson R.G. Solid State Elect. 47 (2003) 2225
3. Mantese J.V., Micheli A.L., Schubring N.W., Catalan A.B., Chen Y.L., Waldo R.A., and Wong C.A. J. Appl. Phys. 72 (1992) 615
4. Kato H., and Kudo A. Chem. Phys. Lett. 295 (1998) 487
5. Trepakov V.A., Jastrabik L., Kapphan S., Giulotto E., and Agranat A.J. Optical Mat. 19 (2000) 13
6. Bursik J., Drbohlav I., Vanek P., and Zelezny V. J. Eur. Ceram. Soc. 24 (2004) 455
7. M.P. Pechini, U.S. Patent No. 3.330.697, 11 July 1967
8. Weber I.T., Rousseau A., Guilloux-Viry M., Bouquet V., and Perrin A. Solid State Sci. 7 (2005) 1317
9. Powder Diffraction File, International Centre for Diffraction Data, Newtown Square, PA, US
10. Weber I.T., Garel M., Bouquet V., Rousseau A., Guilloux-Viry M., Longo E., and Perrin A. Thin Solid Films 493 (2005) 139
11. Louër D., and Langford J.I. J. Appl. Crystallogr. 21 (1998) 430
12. Boultif A., and Louër D. J. Appl. Crystallogr. 37 (2004) 724
13. Louër D., and Audebrand N. Adv. X-Ray Anal. 41 (1999) 556
14. Roisnel T., and Rodriguez-Carvajal J. WinPLOTR: A Windows tool for powder diffraction. Mater. Sci. Forum 378-381 (2001) 118
15. (a) J. Rodriguez-Carvajal, FULLPROF: A program for Rietveld refinement and pattern matching analysis, Abstract of the meeting Powder Diffraction, Toulouse, France, pp. 127-128. (FULLPROF is available at http://www-llb-cea.fr/fullweb/powder.htm)
16. Rodriguez-Carvajal J., and Roisnel T. Mater. Sci. Forum 123 (2004) 443-444
17. Langford J.I. In: Prince E., and Stalick J.K. (Eds). Accuracy in Powder Diffraction II. Spec. Publ. vol. 846 (1992), NIST, Gaithersburg, MD 110
18. Langford J.I. In: Snyder R.L., Fiala J., and Bunge H.J. (Eds). Defect and Microstructure Analysis by Diffraction (1999), IUCr/OUP, Oxford 59
19. Louër D. In: Snyder R.L., Fiala J., and Bunge H.J. (Eds). Defect and Microstructure Analysis by Diffraction (1999), IUCr/OUP, Oxford 673
20. Zelezny V., Bursik J., and Vanek P. J. Eur. Ceram. Soc. 25 (2005) 2151
21. Hirano S., Yogo T., Kikuta K., Morishita T., and Ito Y. J. Am. Ceram. Soc. 75 6 (1992) 1701
22. De Wolff P.M. J. Appl. Cryst. 1 (1968) 108
23. Smith G.S., and Snyder R.L. J. Appl. Cryst. 12 (1979) 60
24. Zhurova E.A., Ivanov Y., Zavodnik V., and Tsirelson V. Acta Cryst. B 56 (2000) 594
25. Arakcheeva A., Chapuis G., Grinevitch V., and Shamray V. Acta Cryst. B 57 (2001) 157
26. Louër D., Bataille T., Roisnel T., and Rodriguez-Carvajal J. Powder Diffr. 17 (2002) 262
27. Audebrand N., Raite S., and Louër D. Solid State Sci. 5 (2003) 783
28. Bernardi M.I.B., Cava S., Paiva-Santos C.O., Leite E.R., Paskocimas C.A., and Longo E. J. Eur. Ceram. Soc. 22 (2002) 2911
29. Leite E.R., Maciel A.P., Weber I.T., Lisboa-Filho P.N., Longo E., Paiva-Santos C.O., Andrade A.V.C., Pakoscimas C.A., Maniette Y., and Schreiner W.H. Adv. Mater. 12 (2002) 905
30. Bao D., Kuang A., and Gu H. Phys. Stat. Sol. (a) 163 (1997) 67
31. http://www.mticrystal.com/k2l.html