Deposition and investigation of lanthanum-cerium hexaboride thin films

Journal of Solid State Chemistry

Volumn 179, Issue 9, 2006, Pages 2862-2870

  Kuzanyan, A S ^a   Harutyunyan, S R ^a   Vardanyan, V O ^a   Badalyan, G R ^a   Petrosyan, V A ^a   Kuzanyan, V S ^a   Petrosyan, S I ^a   Karapetyan, V E ^a   Wood, K S ^b   Wu, H D ^b   Gulian, A M ^b  

^a INSTITUTE FOR PHYSICAL RESEARCH   (Armenia)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

(La,Ce)B6; Microstructure; Thermoelectric properties; Thin films; X ray diffraction

Indexed keywords

ELECTRON BEAMS; LANTHANUM ALLOYS; MICROSTRUCTURE; PULSED LASER DEPOSITION; THERMAL EFFECTS; THERMOELECTRICITY; X RAY DIFFRACTION ANALYSIS;

KONDO SCATTERING; LANTHANUM-CERIUM HEXABORIDE; SEEBECK COEFFICIENTS;

THIN FILMS;

EID: 33747425246     PISSN: 00224596     EISSN: 1095726X     Source Type: Journal    
DOI: 10.1016/j.jssc.2006.01.040     Document Type: Article

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