A low power AlSb/InAs HEMT X-band low noise amplifier

Conference Proceedings - International Conference on Indium Phosphide and Related Materials

Volumn 2005, Issue , 2005, Pages 617-620

  Buhrow, B R ^a   Sokolov, V ^a   Riemer, P J ^a   Harff, N E ^a   Tsai, R ^b   Gutierrez Aitken, A ^b   Gilbert, B K ^a   Daniel, E S ^a  

^a MAYO CLINIC   (United States)

^b NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); GAIN CONTROL; INTEGRATED CIRCUITS; SEMICONDUCTING INDIUM COMPOUNDS;

LINEARITY; NOISE AMPLIFIER; PHASE NOISE;

HIGH ELECTRON MOBILITY TRANSISTORS;

EID: 33747424342     PISSN: 10928669     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIPRM.2005.1517572     Document Type: Conference Paper

References (8)

1. th Annual Technical Digest 2003. IEEE, 9-12 Nov. 2003 pages 294-297.
2. J. B. Hacker, J. Bergman, G. Nagy, G. Sullivan, C. Kadow, H. -K. Lin, A. C. Gossard, M. Rodwell, and B. Brar, "An Ultra-Low Power InAs/AlSb HEMT Ka-band Low-Noise Amplifier", IEEE Microwave and Wireless Components Letters, Vol 14, No. 4, April, 2004
3. J. Bergman, G. Nagy, G. Sullivan, B. Brar, C. Kadow, H. -K. Lin, A. Gossard, and M. Rodwell, "InAs/AlSb HFETs with ft and fmax above 150GHz for low-power MMIC", 2003 Intl. Conf. InP and Related Materials Proceedings., May 2003, pp. 219-222.
4. I. D. Robertson and S. Lucyszyn, editors, RFIC and MMIC design and technology, London: The Institution of Electrical Engineers, 2001.
5. J. L. Carbonero, G. Morin, B. Cabon; "Comparison Between Beryllium-Copper and Tungsten High Frequency Air Coplanar Probes", Microwave Theory and Techniques, IEEE Transactions on, Volume 43, Issue 12, Dec.-1995, Pages 2786-2793
6. D. Boyd, "Calculate the Uncertainty of NF Measurements", October 1999, Pages 93-102
7. D. Vondran, "Noise Figure Measurement: Corrections Related to Match and Gain", Microwave Journal, March 1999
8. A. Hati, D. A. Howe, F. L. Walls, and D. Walker, "Noise Figure vs. PM Noise Measurements: A Study at Microwave Frequencies" Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum, 2003. Proceedings of the 2003 IEEE International, 4-8 May 2003 Pages:516-520