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Volumn 100, Issue 3, 2006, Pages
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Microstructure-dependent dielectric properties of TbMnO3 in Au/TbMnO3/YBa2Cu3O7-x capacitors
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CAPACITORS;
DIELECTRIC PROPERTIES;
EPITAXIAL GROWTH;
MICROSTRUCTURE;
PERMITTIVITY;
SEMICONDUCTING FILMS;
X RAY DIFFRACTION;
YTTERBIUM COMPOUNDS;
EPITAXIAL ORIENTATION;
LAO SUBSTRATE;
TBMNO3;
YBCO LAYERS;
TERBIUM COMPOUNDS;
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EID: 33747342400
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2220479 Document Type: Article |
Times cited : (19)
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References (19)
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