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Volumn 100, Issue 3, 2006, Pages

Microstructure-dependent dielectric properties of TbMnO3 in Au/TbMnO3/YBa2Cu3O7-x capacitors

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAPACITORS; DIELECTRIC PROPERTIES; EPITAXIAL GROWTH; MICROSTRUCTURE; PERMITTIVITY; SEMICONDUCTING FILMS; X RAY DIFFRACTION; YTTERBIUM COMPOUNDS;

EID: 33747342400     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2220479     Document Type: Article
Times cited : (19)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.