Quantifying surface normal estimation

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6240, Issue , 2006, Pages

  Reid, Robert B ^a   Oxley, Mark E ^a   Eismann, Michael T ^b   Goda, Matthew E ^a  

^a Air Force Institute of Technology   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

Long wave infrared; LWIR; Polarimetry; Polarization; Stokes vector; Surface normal; Surface normal estimation

Indexed keywords

ALGORITHMS; ESTIMATION; IMAGE ANALYSIS; LIGHT POLARIZATION; POLARIMETERS; SENSITIVITY ANALYSIS;

INVERSE ALGORITHMS; LONG-WAVE INFRARED (LWIR); STOKES VECTOR; SURFACE NORMAL ESTIMATION;

INFRARED IMAGING;

EID: 33747338741     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.664161     Document Type: Conference Paper

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