Critical size for defects in nanostructured materials

Journal of Applied Physics

Volumn 100, Issue 3, 2006, Pages

  Narayan, Jagdish ^a  

^a North Carolina State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL SIZE; DEFECT CONTENT; NANOSTRUCTURED SYSTEM; SOLID STATE MATERIAL;

CRYSTAL DEFECTS; EFFICIENCY; GRAIN SIZE AND SHAPE; INTERFACES (MATERIALS); RELIABILITY; STABILITY;

NANOSTRUCTURED MATERIALS;

EID: 33747334612     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2220472     Document Type: Article

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