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Volumn 63, Issue 7, 1988, Pages 2260-2266

Large grain polycrystalline silicon by low-temperature annealing of low-pressure chemical vapor deposited amorphous silicon films

Author keywords

[No Author keywords available]

Indexed keywords


EID: 33747286911     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.341065     Document Type: Article
Times cited : (284)

References (31)
  • 18
    • 84950813496 scopus 로고
    • ASTM Standard E112-84, “Standard Methods for Determining Average Grain Size,” (American Society for Testing and Materials, Philadelphia,)
    • (1984)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.