A review of catastrophic electromagnetic breakdown for short pulse widths

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2843, Issue , 1996, Pages 172-182

  Agee, Forrest J ^a   Scholfield, David W ^a   Copeland, Richard P ^a   Martin, T H ^a   Carroll, James J ^b   Mankowski, John J ^c   Kristiansen, M ^c   Hatfield, Lynn L ^c  

^a AIR FORCE RESEARCH LABORATORY   (United States)

^b YOUNGSTOWN STATE UNIVERSITY   (United States)

^c Department of Electrical and Computer Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXPERIMENTAL RESEARCH; HIGH VOLTAGE; LONG PULSE; PULSEWIDTHS; RF BREAKDOWN; SHORT PULSE; SHORT PULSE WIDTH;

OPTICAL ENGINEERING;

EID: 33747275275     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.255410     Document Type: Conference Paper

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