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Volumn 252, Issue 20, 2006, Pages 7383-7388
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X-ray topography of polydiacetylene single crystals prepared by using physical vapor growth technique
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Author keywords
Atomic force microscopy; Physical vapor growth; Polydiacetylene; Single crystal; X ray topography
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
MOLECULAR BEAMS;
MORPHOLOGY;
PHYSICAL VAPOR DEPOSITION;
SINGLE CRYSTALS;
X RAY ANALYSIS;
PHYSICAL VAPOR GROWTH;
POLYDIACETYLENE;
X-RAY TOPOGRAPHY;
POLYMERS;
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EID: 33747231925
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2005.08.097 Document Type: Article |
Times cited : (4)
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References (15)
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