SIMS depth profiling of rubber-tyre cord bonding layers prepared using 64 Zn depleted ZnO

Applied Surface Science

Volumn 252, Issue 19, 2006, Pages 7074-7077

  Fulton, W S ^a   Sykes, D E ^b   Smith, G C ^c  

^a OMG UK Ltd   (United Kingdom)

^b Loughborough Surface Analysis Ltd   (United Kingdom)

^c SHELL GLOBAL SOLUTIONS INTERNATIONAL B V   (United States)

Author keywords

Isotope ratio; SIMS depth profiling; Tyre cord adhesion

Indexed keywords

BONDING; SECONDARY ION MASS SPECTROMETRY; SURFACE CHEMISTRY; VULCANIZATION; ZINC OXIDE; ZINC SULFIDE;

ISOTOPE RATIO; SIMS DEPTH PROFILING; TYRE CORD ADHESION;

RUBBER;

EID: 33747202211     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.02.105     Document Type: Article

References (7)

1. See e.g.,. Van Ooij W.J. In: Crowther B. (Ed). Handbook of Rubber Bonding (2001), RAPRA Technologies, Shrewsbury, UK 350 (and references therein)
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3. Kim J.M., and Van Ooij W.J. Rubber Chem. Technol. 75 (2002) 199
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5. Fulton W.S., Smith G.C., and Titchener K.J. Appl. Surf. Sci. 221 (2004) 69
6. W.S. Fulton, Rubber Division Meeting, American Chemical Society, Paper no. 84, Columbus, October 2004.
7. Chapman A.V., and Porter M. In: Roberts A.D. (Ed). Natural Rubber Science and Technology (1988), Oxford University Press, Oxford 511