Secondary ion statistics and determination of nanocluster (m > 10 7 amu) ion registration efficiency

Applied Surface Science

Volumn 252, Issue 19, 2006, Pages 7034-7037

  Novikov, A V ^a   Kirillov, S N ^a   Baranov, I A ^a   Obnorskii, V V ^a   Yarmiychuk, S V ^a  

^a KHLOPIN RADIUM INSTITUTE   (Russian Federation)

Author keywords

Nanocluster; Registration efficiency; Statistics

Indexed keywords

FISSION PRODUCTS; IONS; MASS SPECTROMETERS; POISSON DISTRIBUTION; STATISTICS;

NANOCLUSTER; NANODISPERSED TARGETS; REGISTRATION EFFICIENCY (RE);

NANOSTRUCTURED MATERIALS;

EID: 33747188087     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.02.268     Document Type: Article

References (9)

1. Haberland H. Nucl. Phys. A 649 (1999) 415c
2. Pauwels B., et al. Phys. Rev. B 62 (2000) 10383
3. Milani P., and Iannotta S. Cluster Beam Synthesis of Nanostructured Materials (1999), Springer Verlag
4. Martens J., et al. Rapid Commun. Mass-Spectrom. 6 (1992) 1463
5. Nguyen V.-T., Wien K., Baranov I., et al. Rapid Commun. Mass Spectrom. (1996) 1463
6. Baranov I., et al. SIMS XII Proceedings of the Conference. Elsevier (2000) 303
7. Baranov I., Novikov A., Obnorskii V., and Reimann C.T. Nucl. Instr. Meth. B 146 (1998) 154
8. Baranov I., Kirillov S., Novikov A., Obnorsky V., Pchelintsev A., and Yarmiychuk S. Nucl. Instr. Meth. B 183 (2001) 232
9. Baranov I., et al. Nucl. Instr. Meth. B 157 (1999) 167