Beam-test of CMOS pixel sensors with 6 GeV electrons

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 565, Issue 1, 2006, Pages 119-125

  Contarato, D ^a,b   Adamus, M ^c   Ciborowski, J ^d,e   Fretwurst, E ^a   Haas, T ^b   Hauschildt, J ^b   Klanner, R ^a   Kotz U ^b   Lohr B ^b   Muhl, C ^b   Polini, A ^f   Sztuk, J ^a   Tyszkiewicz, A ^e   Zeuner, W ^b  

^a UNIVERSITY OF HAMBURG   (Germany)

^b DESY   (Germany)

^c INSTITUTE OF NUCLEAR CHEMISTRY AND TECHNOLOGY   (Poland)

^d UNIVERSITY OF WARSAW   (Poland)

^e UNIVERSITY OF LODZ   (Poland)

^f INFN SEZIONE DI BOLOGNA   (Italy)

Author keywords

CMOS; Monolithic pixel sensors; Particle tracking; Silicon pixel detectors; Solid state detectors

Indexed keywords

ELECTRON BEAMS; ELECTRONS; OPTICAL RESOLVING POWER; PARTICLE BEAM TRACKING; SILICON SENSORS; TELESCOPES;

CMOS; MONOLITHIC PIXEL SENSORS; PARTICLE TRACKING; SILICON PIXEL DETECTORS; SOLID-STATE DETECTORS;

CMOS INTEGRATED CIRCUITS;

EID: 33747186353     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2006.04.068     Document Type: Article

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