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Volumn 252, Issue 20, 2006, Pages 7532-7538

Deactivation of TiO 2 photocatalytic films loaded on aluminium: XPS and AFM analyses

Author keywords

Aluminium; Deactivation; Dip coating; Photocatalysis; Substrate; TiO 2 film

Indexed keywords

ACTIVATION ANALYSIS; ALUMINUM; ATOMIC FORCE MICROSCOPY; PHOTOCATALYSIS; PHOTODEGRADATION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 33747175982     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.09.023     Document Type: Article
Times cited : (53)

References (9)
  • 8
    • 33747182100 scopus 로고    scopus 로고
    • Perkin-Elmer Corporation, PHI 5300 Instrument Manual, USA, 1992.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.