Product testing

IEEE Potentials

Volumn 23, Issue 2, 2004, Pages 17-20

  Floyd, Raymond E ^a   Spencer, Richard H ^a  

^a NONE

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EID: 33747040012     PISSN: 02786648     EISSN: None     Source Type: Journal    
DOI: 10.1109/MP.2004.1289993     Document Type: Review

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