메뉴 건너뛰기




Volumn 46, Issue 14, 2006, Pages 1764-1769

A three-dimensional measure of surface roughness based on mathematical morphology

Author keywords

Areal parameters; Envelope system; Morphological filters; Surface texture characterization

Indexed keywords

INDUSTRIAL APPLICATIONS; INTERFEROMETRY; MACHINE TOOLS; MATHEMATICAL MORPHOLOGY; SURFACE ROUGHNESS; THREE DIMENSIONAL;

EID: 33746948363     PISSN: 08906955     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijmachtools.2005.12.003     Document Type: Article
Times cited : (32)

References (16)
  • 1
    • 33746939624 scopus 로고    scopus 로고
    • K. Stout (Ed.), Methods for the Development of Surface Parameters in Three Dimensions, Kogan Page Science, London, 2000.
  • 3
    • 33747021277 scopus 로고    scopus 로고
    • ISO TC 213 Workgroup 16, Geometrical Product Specifications (GPS)-Surface Texture: Areal-Part 2: Terms, Definitions and Surface Texture Parameters, standard proposal N756, 2005.
  • 5
    • 33746996781 scopus 로고    scopus 로고
    • ISO 4287:1997, Geometrical Product Specifications (GPS)-Surface Texture: Profile method, 1997.
  • 7
    • 0026359601 scopus 로고
    • A Fortran subroutine for cartographic generalization
    • Wolf G.W. A Fortran subroutine for cartographic generalization. Computers and Geoscience 17 10 (1991) 1359-1381
    • (1991) Computers and Geoscience , vol.17 , Issue.10 , pp. 1359-1381
    • Wolf, G.W.1
  • 9
    • 33747019059 scopus 로고    scopus 로고
    • B. Jähne (Ed.), Handbook of Computer Vision and Applications, vol. 2, Academic Press, San Diego, 1999.
  • 11
    • 33746953883 scopus 로고    scopus 로고
    • ISO 16610, Geometrical product specifications (GPS)-Filtration-Part 1: Overview and Basic Concepts, 2004.
  • 12
    • 33746954923 scopus 로고    scopus 로고
    • M. Dietzsch, M. Gerlach, S. Gröger, Back to the envelope system with morphological operations for the evaluation of surfaces, in: T.Thomas, B. Rosen, H. Zahouani (Eds.), Proceedings of the 10th International Conference on Metrology and Properties of Engineering Surfaces, Saint-Etienne, France, 2005, pp. 143-151.
  • 13
    • 17144426675 scopus 로고    scopus 로고
    • Pattern analysis and metrology: the extraction of stable features from observable measurements
    • Scott P.J. Pattern analysis and metrology: the extraction of stable features from observable measurements. Proceedings of the Royal Society of London, Series A 460 (2004) 2845-2864
    • (2004) Proceedings of the Royal Society of London, Series A , vol.460 , pp. 2845-2864
    • Scott, P.J.1
  • 14
    • 33747004027 scopus 로고    scopus 로고
    • Zygo Corporation, Middlefield, Metropro Reference Guide, 2004.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.