-
1
-
-
0033330246
-
-
Che, Y.; Sugihara, O.; Egami, C.; Fujimura, H.; Kawata, Y.; Okamoto, N.; Tsuchimori, M.; Watanabe, O. Jpn. J. Appl. Phys. 1999, 38, 6316.
-
(1999)
Jpn. J. Appl. Phys.
, vol.38
, pp. 6316
-
-
Che, Y.1
Sugihara, O.2
Egami, C.3
Fujimura, H.4
Kawata, Y.5
Okamoto, N.6
Tsuchimori, M.7
Watanabe, O.8
-
2
-
-
0030572127
-
-
Yoo, S. J. B.; Caneau, C.; Bhat, R.; Koza, M. A.; Rajhel, A.; Antoniades, N. Appl. Phys. Lett. 1996, 68, 2609.
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 2609
-
-
Yoo, S.J.B.1
Caneau, C.2
Bhat, R.3
Koza, M.A.4
Rajhel, A.5
Antoniades, N.6
-
3
-
-
0037211072
-
-
Che, Y.; Sugihara, O.; Fujimura, H.; Okamoto, N.; Egami, C.; Kawata, Y.; Tsuchimori, M.; Watanabe, O. Opt. Mater. 2002, 21, 79.
-
(2002)
Opt. Mater.
, vol.21
, pp. 79
-
-
Che, Y.1
Sugihara, O.2
Fujimura, H.3
Okamoto, N.4
Egami, C.5
Kawata, Y.6
Tsuchimori, M.7
Watanabe, O.8
-
4
-
-
0037177135
-
-
Martin, G.; Toussaere, E.; Soulier, L.; Zyss, J. Synth. Met. 2002, 127, 49.
-
(2002)
Synth. Met.
, vol.127
, pp. 49
-
-
Martin, G.1
Toussaere, E.2
Soulier, L.3
Zyss, J.4
-
5
-
-
0347764646
-
-
Ju, J. J.; Kim, J.; Do, J. Y.; Kim, M.-S.; Park, S. K.; Park, S.; Lee, M.-H. Opt. Lett. 2004, 29, 89.
-
(2004)
Opt. Lett.
, vol.29
, pp. 89
-
-
Ju, J.J.1
Kim, J.2
Do, J.Y.3
Kim, M.-S.4
Park, S.K.5
Park, S.6
Lee, M.-H.7
-
6
-
-
0032561588
-
-
Sugihara, O.; Che, Y.; Okamoto, N.; Fujimura, H.; Egami, C.; Umegaki, S. J. Appl. Phys. 1998, 73, 3028.
-
(1998)
J. Appl. Phys.
, vol.73
, pp. 3028
-
-
Sugihara, O.1
Che, Y.2
Okamoto, N.3
Fujimura, H.4
Egami, C.5
Umegaki, S.6
-
7
-
-
12844262830
-
-
Chang, H. J.; Kang, B.; Choi, H.; Wu, J. W. Opt. Lett. 2005, 30, 183.
-
(2005)
Opt. Lett.
, vol.30
, pp. 183
-
-
Chang, H.J.1
Kang, B.2
Choi, H.3
Wu, J.W.4
-
8
-
-
0030246164
-
-
Otomo, A.; Jäger, M.; Stegeman, G. I.; Flipse, M. C.; Diemeer, M. Appl. Phys. Lett. 1996, 69, 1991.
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 1991
-
-
Otomo, A.1
Jäger, M.2
Stegeman, G.I.3
Flipse, M.C.4
Diemeer, M.5
-
9
-
-
0141903460
-
-
Rodriguez, V.; Adamietz, F.; Sanguinet, L.; Buffeteau, T.; Sourisseau, C. J. Phys. Chem. B 2003, 107, 9736.
-
(2003)
J. Phys. Chem. B
, vol.107
, pp. 9736
-
-
Rodriguez, V.1
Adamietz, F.2
Sanguinet, L.3
Buffeteau, T.4
Sourisseau, C.5
-
10
-
-
2942746485
-
-
Lagugné-Labarthet, F.; Bruneel, J. L.; Buffeteau, T.; Sourisseau, C. J. Phys. Chem. B 2004, 108, 6949.
-
(2004)
J. Phys. Chem. B
, vol.108
, pp. 6949
-
-
Lagugné-Labarthet, F.1
Bruneel, J.L.2
Buffeteau, T.3
Sourisseau, C.4
-
11
-
-
0042743864
-
-
Schaller, R. D.; Saykally, R. J.; Shen, Y. R.; Lagugné-Labarthet, F. Opt. Lett. 2003, 28, 1296.
-
(2003)
Opt. Lett.
, vol.28
, pp. 1296
-
-
Schaller, R.D.1
Saykally, R.J.2
Shen, Y.R.3
Lagugné-Labarthet, F.4
-
12
-
-
0014800579
-
-
Dakss, M. L.; Kuhn, L.; Heidrich, P. F.; Scott, B. A. Appl. Phys. Lett. 1970, 16, 523.
-
(1970)
Appl. Phys. Lett.
, vol.16
, pp. 523
-
-
Dakss, M.L.1
Kuhn, L.2
Heidrich, P.F.3
Scott, B.A.4
-
13
-
-
9144251073
-
-
Lagugné-Labarthet, F.; Sourisseau, C.; Schaller, R. D.; Saykally, R. J.; Rochon, P. L. J. Phys. Chem. B 2004, 108, 17059.
-
(2004)
J. Phys. Chem. B
, vol.108
, pp. 17059
-
-
Lagugné-Labarthet, F.1
Sourisseau, C.2
Schaller, R.D.3
Saykally, R.J.4
Rochon, P.L.5
-
14
-
-
0002415201
-
-
Maker, P. D.; Terhune, R. W.; Nisenhoff, M.; Savage, C. M. Phys. Rev. Lett. 1962, 8, 21.
-
(1962)
Phys. Rev. Lett.
, vol.8
, pp. 21
-
-
Maker, P.D.1
Terhune, R.W.2
Nisenhoff, M.3
Savage, C.M.4
-
16
-
-
0442295458
-
-
Lagugné-Labarthet, F.; Bruneel, J. L.; Rodriguez, V.; Sourisseau, C. J. Phys. Chem. B 2004, 108, 1267.
-
(2004)
J. Phys. Chem. B
, vol.108
, pp. 1267
-
-
Lagugné-Labarthet, F.1
Bruneel, J.L.2
Rodriguez, V.3
Sourisseau, C.4
-
17
-
-
84975565868
-
-
Kuzyk, M. G.; Singer, K. D.; Zahn, H. E.; King, L. A. J. Opt. Soc. Am. 1989, 6, 742.
-
(1989)
J. Opt. Soc. Am.
, vol.6
, pp. 742
-
-
Kuzyk, M.G.1
Singer, K.D.2
Zahn, H.E.3
King, L.A.4
-
18
-
-
84906360246
-
-
note
-
Very intense SH enhancements as large as 6-7 were sometimes observed in other grating areas; these differences could come from variations in the thickness and/or surface relief amplitude.
-
-
-
|