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EPJ Applied Physics

Volumn 35, Issue 1, 2006, Pages 43-47

Microstructure, dielectric and ferroelectric characterization of Ba doped PLZT ceramics

(2) Ramam, K a Miguel, V a

a UNIVERSITY OF CONCEPCIÓN (Chile)

Author keywords

[No Author keywords available]

Indexed keywords

DOPING (ADDITIVES); FERROELECTRICITY; GRAIN SIZE AND SHAPE; MICROSTRUCTURE; POLARIZATION; SCANNING ELECTRON MICROSCOPY;

MIXED-OXIDE METHOD; PLZT CERAMICS; RHOMBOHEDRAL; TETRAGONAL PHASE;

CERAMIC MATERIALS;

EID: 33746907802 PISSN: 12860042 EISSN: 12860050 Source Type: Journal
DOI: 10.1051/epjap:2006065 Document Type: Article

Times cited : (20)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.