Bidirectional PCA with assembled matrix distance metric for image recognition

IEEE Transactions on Systems, Man, and Cybernetics, Part B: Cybernetics

Volumn 36, Issue 4, 2006, Pages 863-872

  Zuo, Wangmeng ^a   Zhang, David ^b   Wang, Kuanquan ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

^b HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

Face recognition; Feature extraction; Image recognition; Nearest feature line; Palm print recognition; Principal component analysis (PCA)

Indexed keywords

FEATURE EXTRACTION; MATRIX ALGEBRA; OBJECT RECOGNITION; PRINCIPAL COMPONENT ANALYSIS;

ASSEMBLED MATRIX DISTANCE METRIC; NEAREST FEATURE LINE CLASSIFIERS;

FACE RECOGNITION;

ALGORITHM; ARTICLE; ARTIFICIAL INTELLIGENCE; AUTOMATED PATTERN RECOGNITION; BIOMETRY; COMPUTER ASSISTED DIAGNOSIS; COMPUTER SIMULATION; FACE; HISTOLOGY; HUMAN; IMAGE ENHANCEMENT; INFORMATION RETRIEVAL; METHODOLOGY; PRINCIPAL COMPONENT ANALYSIS; STATISTICAL MODEL;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; BIOMETRY; COMPUTER SIMULATION; FACE; HUMANS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; INFORMATION STORAGE AND RETRIEVAL; MODELS, STATISTICAL; PATTERN RECOGNITION, AUTOMATED; PRINCIPAL COMPONENT ANALYSIS;

EID: 33746804077     PISSN: 10834419     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSMCB.2006.872274     Document Type: Article

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