Information-theoretic analysis of capacitive physical unclonable functions

Journal of Applied Physics

Volumn 100, Issue 2, 2006, Pages

  Skoric B ^a   Maubach, S ^a   Kevenaar, T ^a   Tuyls, P ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; COATING TECHNIQUES; ELEMENTARY PARTICLES; ENTROPY; NOISE ABATEMENT; NUMERICAL METHODS; PERMITTIVITY MEASUREMENT; RANDOM PROCESSES; SENSORS;

EXTRACTABLE BIT; NOISY REGIME; PHYSICAL UNCLONABLE FUNCTIONS (PUF); RANDOMLY DISTRIBUTED PARTICLE;

PUBLIC KEY CRYPTOGRAPHY;

EID: 33746785063     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2209532     Document Type: Article

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