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Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6194, Issue , 2006, Pages

Characterization of speckle/despeckling in active millimeter wave imaging systems using a first order 1.5D model

(9) Ocket, I a Nauwelaers, B a Fostier, J b Meert, L b Olyslager, F b Koers, G c Stiens, J c Vounckx, R c Jager, I c

a UNIVERSITY OF LEUVEN (Belgium)

b GHENT UNIVERSITY (Belgium)

c VRIJE UNIVERSITEIT BRUSSEL (Belgium)

Author keywords

Active millimeter wave imaging; Hadamard; Huygens; Method of moments; Speckle

Indexed keywords

DIFFUSERS (FLUID); GUNS (ARMAMENT); METHOD OF MOMENTS; MIRRORS; SENSORS; SPECKLE;

ACTIVE MILLIMETER WAVE IMAGING; HADAMARD; HUYGENS;

IMAGING SYSTEMS;

EID: 33746761736 PISSN: 0277786X EISSN: None Source Type: Conference Proceeding
DOI: 10.1117/12.661689 Document Type: Conference Paper

Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.