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Volumn 1, Issue , 2005, Pages 278-283
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Applications of FSV to EMC and SI data
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Author keywords
FDTD; FIT; FSV; H Spice; Validation
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Indexed keywords
DATA REDUCTION;
ELECTRIC FIELDS;
MATHEMATICAL MODELS;
NETWORKS (CIRCUITS);
SIGNAL INTERFERENCE;
FDTD;
FIT;
FSV;
H-SPICE;
VALIDATION;
ELECTROMAGNETIC COMPATIBILITY;
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EID: 33746714976
PISSN: 10774076
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ISEMC.2005.1513514 Document Type: Conference Paper |
Times cited : (14)
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References (7)
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