Adaptive random testing by bisection and localization

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 3997 LNCS, Issue , 2006, Pages 72-86

  Mayer, Johannes ^a  

^a UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADAPTIVE SYSTEMS; ALGORITHMS; COMPUTATIONAL METHODS; COMPUTER SCIENCE; COMPUTER SYSTEM RECOVERY; RANDOM PROCESSES;

ADAPTIVE RANDOM TESTING (ART); BISECTION; DISTANCE COMPUTATIONS; LOCALIZATION; RUNTIME;

DESIGN FOR TESTABILITY;

EID: 33746665938     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/11759744_6     Document Type: Conference Paper

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