Model estimated uncertainties in the calibration of a total reflection x-ray fluorescence spectrometer using single-element standards

X-Ray Spectrometry

Volumn 35, Issue 4, 2006, Pages 249-252

  Owoade, O K ^a   Olise, F S ^a   Olaniyi, H B ^a   Wegrzynek, D ^b  

^a OBAFEMI AWOLOWO UNIVERSITY   (Nigeria)

^b INTERNATIONAL ATOMIC ENERGY AGENCY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; UNCERTAINTY ANALYSIS;

ANALYTES; CALCULATED VALUES; LOW CONCENTRATIONS; REPRODUCIBILITIES; SINGLE ELEMENT; SPECTROMETRIC ANALYSIS; TOTAL REFLECTION X-RAY FLUORESCENCE; UNCERTAINTY; UNCERTAINTY MODELS; X-RAY FLUORESCENCE SPECTROMETER;

FLUORESCENCE;

EID: 33746648036     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.896     Document Type: Article

References (9)

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9. ISO. Guide to the Expression of Uncertainty in Measurement. International Organization for Standardization: Geneva, 1995.