A Method of Inspecting Non-woven Basis Weight Using the Exponential Law of Absorption and Image Processing

Textile Research Journal

Volumn 76, Issue 7, 2006, Pages 547-558

  Lien, Hsin Chung ^a   Liu, Chih Hua ^a  

^a TECHNOLOGY AND SCIENCE INSTITUTE OF NORTHERN TAIWAN   (Taiwan)

Author keywords

exponential law of absorption; image processing; non woven basis weight

Indexed keywords

ABSORPTION; CHARGE COUPLED DEVICES; IMAGE PROCESSING; IMAGING TECHNIQUES; LEAST SQUARES APPROXIMATIONS;

EXPONENTIAL LAW; LIGHT SOURCE COMPENSATION; NON-WOVEN BASIS WEIGHT;

NONWOVEN FABRICS;

ABSORPTION; BASIS WEIGHT; INSPECTION; NONWOVENS;

ABSORPTION; IMAGE ANALYSIS; INSPECTION; MATHEMATICAL ANALYSIS; NONWOVEN FABRIC;

EID: 33746648029     PISSN: 00405175     EISSN: None     Source Type: Journal    
DOI: 10.1177/0040517506060141     Document Type: Article

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