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Volumn 8, Issue 8, 2006, Pages 1225-1228

Electrostatic broadening of current-free spots in a fuel cell stack: The mechanism of stack aging?

Author keywords

Aging; Current free spots; Fuel cell stack; Modeling

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; ELECTROSTATICS; MATHEMATICAL MODELS; PERTURBATION TECHNIQUES;

EID: 33746600726     PISSN: 13882481     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elecom.2006.05.010     Document Type: Article
Times cited : (18)

References (2)
  • 1
    • 33750134724 scopus 로고    scopus 로고
    • A.A. Kulikovsky, Model of DMFC stack: resistive "spots" and stack performance, J. Electrochem. Soc. 153 (2006), in press.
  • 2
    • 33748434586 scopus 로고    scopus 로고
    • A.A. Kulikovsky, Voltage loss in bipolar plates in a fuel cell stack, J. Power Sources (2006), in press, doi:10.1016/j.jpowsour.2006.01.058.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.