메뉴 건너뛰기




Volumn 38, Issue 5, 2006, Pages 777-779

Generation of 1/f noise based on the integration of FFT with wavelet transform

Author keywords

1 f noise; FFT; Optic gyroscope; Wavelet transform

Indexed keywords

FAST FOURIER TRANSFORMS; FRACTALS; GYROSCOPES; WAVELET TRANSFORMS;

EID: 33746497842     PISSN: 03676234     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (2)

References (7)
  • 1
    • 0010039245 scopus 로고    scopus 로고
    • IEEE standard specification format guide and test procedure for single-axis laser gyros
    • IEEE Std 647-1995
    • IEEE Std 647-1995. IEEE standard specification format guide and test procedure for single-axis laser gyros [S]. 1998: 65-76.
    • (1998) , pp. 65-76
  • 3
    • 0027680633 scopus 로고
    • Wavelet-based representations for the 1/f family of fractal processes
    • WORNELL G W. Wavelet-based representations for the 1/f family of fractal processes [J]. The proceeding of IEEE, 1993, 81 (10): 1428-1450.
    • (1993) The proceeding of IEEE , vol.81 , Issue.10 , pp. 1428-1450
    • Wornell, G.W.1
  • 4
    • 0028466653 scopus 로고
    • Wavelet representations of stochastic processes and multi-resolution stochastic models
    • DIJKERMAN R W, MAZUMDAR R R. Wavelet representations of stochastic processes and multi-resolution stochastic models] [J]. The proceeding of IEEE, 1994, 42 (7): 1640-1652.
    • (1994) The proceeding of IEEE , vol.42 , Issue.7 , pp. 1640-1652
    • Dijkerman, R.W.1    Mazumdar, R.R.2
  • 5
    • 0025462413 scopus 로고
    • A karhunen-loeve-like expansion for 1/f processes via wavelet
    • WORNELL G W. A karhunen-loeve-like expansion for 1/f processes via wavelet [J]. The Proceeding of IEEE, 1990, 36 (4): 859-861.
    • (1990) The Proceeding of IEEE , vol.36 , Issue.4 , pp. 859-861
    • Wornell, G.W.1
  • 6
    • 33746493391 scopus 로고    scopus 로고
    • Chinese source
  • 7
    • 84897386934 scopus 로고
    • Statistic of atomic frequency standard
    • ALLAN D W. Statistic of atomic frequency standard [J]. Proceedings of the IEEE, 1966, 54 (2): 221-230.
    • (1966) Proceedings of the IEEE , vol.54 , Issue.2 , pp. 221-230
    • Allan, D.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.