Structural influence on Raman scattering of a new C60 thin film prepared by AAO template with the method of pressure difference

Journal of Combinatorial Chemistry

Volumn 8, Issue 4, 2006, Pages 500-504

  Luo, Zhixun ^a   Fang, Yan ^a  

^a CAPITAL NORMAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ALUMINUM OXIDE; FULLERENE C60; FULLERENE DERIVATIVE; OXALIC ACID;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; PRESSURE; RAMAN SPECTROMETRY;

ALUMINUM; ALUMINUM OXIDE; FULLERENES; MICROSCOPY, ATOMIC FORCE; OXALIC ACID; PRESSURE; SPECTRUM ANALYSIS, RAMAN;

EID: 33746328057     PISSN: 15204766     EISSN: None     Source Type: Journal    
DOI: 10.1021/cc050140a     Document Type: Article

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