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Volumn 3, Issue , 2006, Pages 1779-1782
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Multiple defects in GaInN multiple quantum wells grown on ELO GaN layers and on GaN substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
C-AXIS;
PLANAR DEFECTS;
QUANTUM WELL LAYERS;
STRUCTURAL DEFECTS;
61.72.LK;
68.37.LP;
68.65.FG;
81.05.EA;
INVERSION DOMAINS;
MULTIPLE QUANTUM-WELL STRUCTURES;
TRANSMISSION ELECTRON;
CRYSTAL DEFECTS;
GALLIUM NITRIDE;
NUCLEATION;
SEMICONDUCTOR GROWTH;
TRANSMISSION ELECTRON MICROSCOPY;
INVERSION LAYERS;
SEMICONDUCTOR QUANTUM WELLS;
SURFACE DEFECTS;
SEMICONDUCTOR QUANTUM WELLS;
EDGE DISLOCATIONS;
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EID: 33746324533
PISSN: 18626351
EISSN: None
Source Type: Journal
DOI: 10.1002/pssc.200565347 Document Type: Conference Paper |
Times cited : (7)
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References (10)
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