Effects of oxide layer thickness on Si-nanocrystal photoluminescence intensity in Si+-implanted SiO2/Si systems

Applied Physics Letters

Volumn 89, Issue 3, 2006, Pages

  Barba, D ^a   Martin, F ^a   Dahmoune, C ^a   Ross, G G ^a  

^a INRS EMT   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; LASER BEAMS; LIGHT EMISSION; LIGHT MODULATION; PHOTOLUMINESCENCE; SILICON COMPOUNDS; SPECTRUM ANALYSIS;

LASER EXCITATIONS; LAYER THICKNESS; SILICON NANOCRYSTALS; SPECTRAL MODULATION;

NANOSTRUCTURED MATERIALS;

EID: 33746317035     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2234739     Document Type: Article

References (18)

1. H. Morisaki, F. W. Ping, H. Ono, and K. Yazawa, J. Appl. Phys. 70, 1869 (1994).
2. Y. Kanzawa, T. Kageyama, S. Takeoka, M. Fujii, S. Hayashi, and K. Yamamoto, Solid State Commun. 102, 553 (1997).
3. F. Iacona, C. Bongiorno, C. Spinella, S. Boninelli, and F. Priolo, J. Appl. Phys. 95, 3723 (2004).
4. Y. Q. Wang, R. Smirani, and G. G. Ross, Nanotechnology 15, 1554 (2004).
5. R. Smirani, F. Martin, G. Abel, Y. Q. Wang, M. Chicoine, and G. G. Ross, J. Lumin. 115, 62 (2005).
6. R. Ferre, B. Garrido, P. Pellegrino, M. Peralvarez, C. Garcia, J. A. Moreno, J. Carreras, and J. R. Morante, J. Appl. Phys. 98, 084319 (2005).
7. T. Shimizu-Iwayama, D. E. Hole, and P. D. Townsend, Nucl. Instrum. Methods Phys. Res. B 147, 350 (1999).
8. D. Amans, O. Guillois, G. Ledoux, D. Porterat, and C. Reynaud, J. Appl. Phys. 91, 5334 (2002).
9. L. Polerecky, J. Hamrle, and B. D. MacCraith, Appl. Opt. 39, 3968 (2000).
10. J. P. Biersack and L. G. Haggmark, Nucl. Instrum. Methods 174, 257 (1980).
11. J. F. Ziegler, J. P. Biersack, and U. Littmark, The Stopping and Ion Range of Ions in Matter (Pergamon, New York, 1985).
12. G. G. Ross, R. Smirani, V. Levitcharsky, Y. Q. Wang, G. Veilleux, and R. G. Saint-Jacques, Nucl. Instrum. Methods Phys. Res. B 230, 198 (2005).
13. J. A. Woollam, in Variable Angle Spectroscopic Ellipsometry, Wiley Encyclopedia of Electrical and Electronics Engineering, edited by J. G. Webster (Wiley, New York, 2000).
14. D. A. G. Bruggemann, Ann. Phys. 24, 636 (1935).
15. Spectroscopic Ellipsometry, edited by R. W. Collins, D. E. Apsnes, and E. A. Irenes (Elsevier Science S. A., Lausanne, 1998).
16. Handbook of Optical Constants of Solids, edited by E. D. Palik (Academic, New York, 1985).
17. D. L. Windt, Comput. Phys. 12, 360 (1998).
18. J. A. Moreno, A. Garrido, P. Pellegrino, C. Garcia, J. Arbiol, J. R. Morante, P. Marie, F. Gourbilleau, and R. Rizk, J. Appl. Phys. 98, 013523 (2005).