3D particle positioning from CCD images using the generalized Lorenz-Mie and Huygens-Fresnel theories

Measurement Science and Technology

Volumn 17, Issue 8, 2006, Pages 2328-2334

  Guerrero Viramontes, J A ^a   Moreno Hernandez, D ^a   Mendoza Santoyo, F ^a   Funes Gallanzi, M ^b  

^a CENTRO DE INVESTIGACIONES EN ÓPTICA   (Mexico)

^b AVNTK SC   (Mexico)

Author keywords

Diffraction pattern; Particle position estimation; PIV; Spherical particle seeding

Indexed keywords

CHARGE COUPLED DEVICES; DIFFRACTION; IMAGE ANALYSIS; NUMERICAL ANALYSIS; POSITION MEASUREMENT;

DIFFRACTION PATTERNS; HUYGENS-FRESNEL THEORIES; PARTICLE POSITION ESTIMATION; SPHERICAL PARTICLE SEEDING;

PARTICLES (PARTICULATE MATTER);

CHARGE COUPLED DEVICES; DIFFRACTION; IMAGE ANALYSIS; NUMERICAL ANALYSIS; PARTICLES (PARTICULATE MATTER); POSITION MEASUREMENT;

EID: 33746294721     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/17/8/039     Document Type: Article

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