Investigation of critical behaviour of MgB2 thin films on SiC/Si substrate

Journal of Physics: Conference Series

Volumn 43, Issue 1, 2006, Pages 293-296

  Nishida, A ^a   Taka, C ^a   Chromik, S ^b   Durny, R ^a,c  

^a FUKUOKA UNIVERSITY   (Japan)

^b INSTITUTE OF ELECTRICAL ENGINEERING   (Slovakia)

^c SLOVAK UNIVERSITY OF TECHNOLOGY   (Slovakia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33746289522     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/43/1/073     Document Type: Article

References (16)

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