Defects and impurities in SrTiO3 films: Evidence from ESR

Ferroelectrics

Volumn 239, Issue 1-4, 2000, Pages 349-356

  Bykov, I P ^a   Glinchuk, M D ^b   Laguta, V V ^a   Slipenyuk, A M ^a   Korniyenko, S M ^a   Soukup, L ^a   Jastrabik, L ^a   Dejneka, A ^a  

^a FRANTSEVICH INSTITUTE FOR PROBLEMS OF MATERIALS SCIENCE   (Ukraine)

^b INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

Esr method ellipsometry; Surface center; Thick film; Thin film

Indexed keywords

EID: 33746277141     PISSN: 00150193     EISSN: None     Source Type: Journal    
DOI: 10.1080/00150190008213341     Document Type: Article

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