|
Volumn 2, Issue , 2005, Pages 1393-1397
|
Grain crushing and critical states observed in DEM simulations
|
Author keywords
[No Author keywords available]
|
Indexed keywords
COMPRESSION TESTS;
CRITICAL STATE;
CRUSHABLE GRAINS;
CURRENT STRESS;
DEM SIMULATION;
GRAIN CRUSHING;
VOIDS RATIO;
COMPRESSION TESTING;
CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY);
GRANULAR MATERIALS;
MICROMECHANICS;
POWDERS;
CRUSHING;
|
EID: 33746244822
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (50)
|
References (11)
|