An Automated W-Band On-Wafer Noise Figure Measurement System

41st ARFTG Conference Digest - Spring 1993

Volumn , Issue , 1993, Pages 48-56

  Chen, Sian ^a   Yang, Daniel C ^a   Wang, Huei ^a   Hayashibara, Kit ^a   Godshalk, Edward M ^b   Allen, Barry ^a  

^a NORTHROP GRUMMAN CORPORATION   (United States)

^b Cascade Microtech Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EQUIPMENT TESTING; FIXTURES (TOOLING); LOW NOISE AMPLIFIERS; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;

ASSOCIATED GAIN; FIGURE MEASUREMENT; MEASUREMENT SYSTEM; MONOLITHIC LOW NOISE AMPLIFIER; ON-WAFER PROBES; TEST FIXTURE; TESTING PROCEDURE; W-BAND FREQUENCIES;

NOISE FIGURE;

EID: 33746227059     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1993.327019     Document Type: Conference Paper

References (12)

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