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Volumn 100, Issue 1, 2006, Pages

The defect structure, sintering behavior, and dielectric responses of Cr2O3-doped Sr0.5Ba0.5Nb 2O6

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; DEFECTS; DOPING (ADDITIVES); LATTICE CONSTANTS; PERMITTIVITY; POLARIZATION; SINTERING; X RAY DIFFRACTION;

EID: 33746211120     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2213168     Document Type: Article
Times cited : (14)

References (32)
  • 23
    • 85077194356 scopus 로고    scopus 로고
    • Fundamental physics of ferroelectrics 2000
    • Aspen Center for Physics Winter Workshop, 2000, edited by R. E. Cohen, (AIP, Melville, NY)
    • W. Kleemann, J. Dec, P. Lehen, Th. Woike, and R. Pankrath, Fundamental Physics of Ferroelectrics 2000, Aspen Center for Physics Winter Workshop, 2000, edited by R. E. Cohen, AIP Conf. Proc. No. 535 (AIP, Melville, NY, 2000), pp. 26-29.
    • (2000) AIP Conf. Proc. No. 535 , vol.535 , pp. 26-29
    • Kleemann, W.1    Dec, J.2    Lehen, P.3    Woike, Th.4    Pankrath, R.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.