Bayesian tolerance intervals for the unbalanced one-way random effects model

Journal of Quality Technology

Volumn 38, Issue 3, 2006, Pages 280-293

  Van Der Merwe, Abraham J ^a,b   Pretorius, Albertus L ^a,b   Meyer, Johannes H ^a,b  

^a UNIVERSITY OF THE FREE STATE   (South Africa)

^b Department of Mathematical Statistics ^*  (South Africa)

Author keywords

Bayesian Procedure; Monte Carlo Simulation; Predictive Density; Probability Matching Prior; Random Effects; Reference Prior; Tolerance Intervals

Indexed keywords

COMPUTER SIMULATION; DECISION MAKING; HIERARCHICAL SYSTEMS; MATHEMATICAL MODELS; MONTE CARLO METHODS; PROBABILITY;

BAYESIAN PROCEDURE; PREDICTIVE DENSITY; PROBABILITY MATCHING PRIOR; RANDOM EFFECTS; REFERENCE PRIOR; TOLERANCE INTERVALS;

STATISTICAL METHODS;

EID: 33746172274     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.2006.11918615     Document Type: Article

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